Gaussian beam photothermal single particle microscopy
نویسندگان
چکیده
منابع مشابه
Gaussian beam photothermal single particle microscopy.
We explore the intuitive lensing picture of laser-heated nanoparticles occurring in single particle photothermal (PT) microscopy. The effective focal length of the thermal lens (TL) is derived from a ray-optics treatment and used to transform the probing focused Gaussian beam with ABCD Gaussian matrix optics. The relative PT signal is obtained from the relative beam-waist change far from the TL...
متن کاملPhotothermal single particle Rutherford scattering microscopy.
We demonstrate that the quantum-mechanical description of Rutherford scattering has a photonic counterpart in a new form of single particle photothermal microscopy. Using a split detector we provide experimental evidence that photons are deflected by a photothermal potential that is created by a local refractive index change around a heated nanoparticle. The deflection experienced is shown to b...
متن کاملSingle-particle absorption spectroscopy by photothermal contrast.
Removing effects of sample heterogeneity through single-molecule and single-particle techniques has advanced many fields. While background free luminescence and scattering spectroscopy is widely used, recording the absorption spectrum only is rather difficult. Here we present an approach capable of recording pure absorption spectra of individual nanostructures. We demonstrate the implementation...
متن کاملSingle-beam homodyne SPIDER for multiphoton microscopy.
We report a new version of spectral phase interferometry for direct electric field reconstruction (SPIDER) requiring only a single phase-shaped laser beam. A narrowband probe pulse is selected out of a broadband ultrafast laser pulse by a phase pulse-shaping technique and mixed with the original broadband pulse to generate a second-harmonic generation (SHG) signal. Using another SHG signal sole...
متن کاملAnisotropic Correction of Beam-induced Motion for Improved Single-particle Electron Cryo-microscopy
Correction of electron beam-induced sample motion is one of the major factors contributing to the recent resolution breakthroughs in cryo-electron microscopy. Improving the accuracy and efficiency of motion correction can lead to further resolution improvement. Based on observations that the electron beam induces doming of the thin vitreous ice layer, we developed an algorithm to correct anisot...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of the Optical Society of America A
سال: 2012
ISSN: 1084-7529,1520-8532
DOI: 10.1364/josaa.29.002237